Scale space theory in computer vision
: first international conference, scale space '97, Utrecht, The Netherlands, July 2 - 4, 1997 ; proceedings / Bart ter Haar Romeny ... (ed.). - Berlin : Springer, 1997. - IX, 364 S. : Ill., graph. Darst.; 24 cm - (Lecture notes in computer science; Vol. 1252)
ISBN 978-3-540-63167-5 / 3-540-63167-4 kart. : DM 82.00
Literaturangaben
Quelle: DNB
Presutti, Errico: Scaling limits in statistical mechanics and microstructures in continuum mechanics
/ Errico Presutti. - Berlin : Springer, 2009. - XVI, 467 S. : graph. Darst.; 24 cm - (Theoretical and mathematical physics)
ISBN 978-3-540-73304-1 Pp. : ca. EUR 64.15 (freier Pr.), ca. sfr 98.50 (freier Pr.)
Literaturverz. S. 457 - 464
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Scaling limits in statistical mechanics and microstructures in continuum mechanics
/ Errico Presutti. - Berlin : Springer, 2008. - Online-Ressource - (Theoretical and mathematical physics)
ISBN 978-3-540-73305-8
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Scaling topic maps
: revised selected papers / Third International Conference on Topic Maps Research and Applications, TMRA 2007 Leipzig, Germany, October 11 - 12, 2007. Lutz Maicher ... (ed.). - Berlin : Springer, 2008. - Online-Ressource - (Lecture notes in computer science; 4999 : Lecture notes in artificial intelligence)
ISBN 978-3-540-70874-2
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Scanner et IRM en cancérologie
/ D. Buthiau ; D. Khayat (ed.). - Paris : Springer, 1995. - XXVII, 390 S. : Ill.; 28 cm
ISBN 978-3-540-59612-7 / 3-540-59612-7 Pp. : DM 175.00
Literaturangaben
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Reimer, Ludwig: Scanning electron microscopy
: physics of image formation and microanalysis / Ludwig Reimer. - 2., completely rev. and updated ed. - Berlin : Springer, 1998. - XIV, 527 S. : Ill., graph. Darst.; 24 cm - (Springer series in optical sciences; Vol. 45)
ISBN 978-3-540-63976-3 / 3-540-63976-4 Pp. : DM 149.00
Literaturverz. S. 449 - 514
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Scanning microscopy
: symposium proceedings / R. Kassing (ed.). - Berlin : Springer, 1992. - X, 207 S. : Ill., graph. Darst.; 24 cm - (ESPRIT basic research series)
ISBN 978-3-540-55696-1 / 3-540-55696-6 Pp. : DM 78.00
Literaturverz. S. 189 - 207
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Meyer, Ernst: Scanning probe microscopy
: the lab on a tip / Ernst Meyer ; Hans Josef Hug ; Roland Bennewitz. - Berlin : Springer, 2004. - X, 210 S. : Ill., graph. Darst.; 24 cm - (Advanced texts in physics)
ISBN 978-3-540-43180-0 / 3-540-43180-2 Pp. : EUR 64.15
Literaturverz. S. 181 - 205
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Scanning tunneling microscopy
/ R. Wiesendanger ; H.-J. Güntherodt (ed.). - Berlin : Springer, 1992. - XII, 246 S. : Ill., graph. Darst. - (Springer series in surface sciences; 20)
ISBN 978-3-540-54308-4 / 3-540-54308-2 Pp. : DM 95.00
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Scanning tunneling microscopy
/ R. Wiesendanger ; H.-J. Güntherodt (ed.). - Berlin : Springer, 1992. - XIV, 308 S. : Ill., graph. Darst. - (Springer series in surface sciences; 28)
ISBN 978-3-540-54555-2 / 3-540-54555-7 Pp. : DM 98.00
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