Energy filtering transmission electron microscopy
/ Ludwig Reimer (ed.). With contributions by C. Deininger .... - Berlin : Springer, 1995. - XI, 424 S. : Ill., graph. Darst.; 25 cm - (Springer series in optical sciences; Vol. 71)
ISBN 978-3-540-58479-7 / 3-540-58479-X Pp. : DM 98.00
Literaturangaben
Quelle: DNB
Reimer, Ludwig: Scanning electron microscopy
: physics of image formation and microanalysis / Ludwig Reimer. - 2., completely rev. and updated ed. - Berlin : Springer, 1998. - XIV, 527 S. : Ill., graph. Darst.; 24 cm - (Springer series in optical sciences; Vol. 45)
ISBN 978-3-540-63976-3 / 3-540-63976-4 Pp. : DM 149.00
Literaturverz. S. 449 - 514
Quelle: DNB
Reimer, Ludwig: Transmission electron microscopy
: physics of image formation and microanalysis / Ludwig Reimer. - 4. ed. - Berlin : Springer, 1997. - XVI, 584 S. : Ill., graph. Darst.; 24 cm - (Springer series in optical sciences; Vol. 36)
ISBN 978-3-540-62568-1 / 3-540-62568-2 Pp. : DM 108.00
Literaturverz. S. 494 - 569
Quelle: DNB
Reimer, Ludwig: Transmission electron microscopy
: physics of image formation and microanalysis / Ludwig Reimer. - 3. ed. - Berlin : Springer, 1993. - XIII, 545 S. : Ill., graph. Darst.; 24 cm - (Springer series in optical sciences; Vol. 36)
ISBN 978-3-540-56849-0 / 3-540-56849-2 kart. : DM 98.00
Literaturverz. S. 465 - 533
Quelle: DNB
