Progress in pattern recognition, image analysis and applications
: proceedings / 12th Iberoamerican Congress on Pattern Recognition, CIARP 2007, Viña del Mar-Valparaiso, Chile, November 13 - 16, 2007. Luis Rueda ... (ed.). - Berlin : Springer, 2007. - XXI, 969 S. : Ill., graph. Darst.; 24 cm - (Lecture notes in computer science; Vol. 4756)
ISBN 978-3-540-76724-4 / 3-540-76724-X kart. : EUR 96.30 (freier Pr.), sfr 157.00 (freier Pr.)
Literaturangaben
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