XploRe - learning guide
/ W. Härdle ; S. Klinke ; M. Müller. - Berlin : Springer, 2000. - 526 S. : graph. Darst.; 24 cm
ISBN 978-3-540-66207-5 / 3-540-66207-3 kart. : DM 79.00
Quelle: DNB
Krivoglaz, Michail A.: X-ray and neutron diffraction in nonideal crystals
/ Mikhail A. Krivoglaz. [Transl. Oleg H. Glebov]. - Berlin : Springer, 1996. - XIX, 466 S. : graph. Darst.; 24 cm
ISBN 978-3-540-50564-8 / 3-540-50564-4 Pp. : DM 198.00
Literaturverz. S. 447 - 466
Quelle: DNB
X-ray and neutron reflectivity
: principles and applications / J. Daillant ... (ed.). - Berlin : Springer, 2008. - Online-Ressource - (Lecture notes in physics; 770)
ISBN 978-3-540-88588-7
Lizenzpflichtig
Quelle: DNB
Dric, Viktor A.: X-ray diffraction by disordered lamellar structures
: theory and applications to microdivided silicates and carbons / Victor A. Drits ; Cyril Tchoubar. With the collaboration of G. Besson ... Foreword by André Guinier. [Transl. from French by: R. Setton]. - Berlin : Springer, 1990. - XVII, 371 S. : Ill., graph. Darst.; 24 cm
ISBN 978-3-540-51222-6 / 3-540-51222-5 : DM 268.00
Literaturangaben
Quelle: DNB
Schmidbauer, Martin: X-ray diffuse scattering from self-organized mesoscopic semiconductor structures
/ Martin Schmidbauer. - Berlin : Springer, 2004. - X, 202 S. : graph. Darst.; 24 cm - (Springer tracts in modern physics; Vol. 199)
ISBN 978-3-540-20179-3 / 3-540-20179-3 Pp. : EUR 133.70 (freier Pr.), sfr 202.00
Literaturangaben
Quelle: DNB
X-ray diffuse scattering from self-organized mesoscopic semiconductor structures
/ Martin Schmidbauer. - Berlin : Springer, 2004. - Online-Ressource - (Springer tracts in modern physics; Vol. 199)
ISBN 978-3-540-39986-5
Lizenzpflichtig
Quelle: DNB
X-ray microscopy
- Berlin : Springer, 1992. - XVI, 491 S. : Ill., graph. Darst. - (Springer series in optical sciences; Vol. 67)
ISBN 978-3-540-53605-5 / 3-540-53605-1 Pp. : DM 148.00
Quelle: DNB
X-ray microscopy and spectromicroscopy
/ Jürgen Thieme ... (ed.). - Berlin : Springer, 1998. - 399 S. in getr. Zählung : Ill., graph. Darst.; 25 cm
ISBN 978-3-540-63998-5 : DM 198.00
Literaturangaben
Quelle: DNB
Chang, Shih-Lin: X-Ray multiple wave diffraction
: theory and application / Shih-Lin Chang. - Berlin : Springer, 2004. - XII, 431 S. : Ill., graph. Darst.; 24 cm - (Springer series in solid-state sciences; 143)
ISBN 978-3-540-21196-9 / 3-540-21196-9 Pp. : EUR 139.05
Literaturverz. S. 387 - 407
Quelle: DNB Verlagsmeldungen
Stribeck, Norbert: X-ray scattering of soft matter
: with 6 tables / Norbert Stribeck. - Berlin : Springer, 2007. - XX, 238 S. : Ill., graph. Darst.; 24 cm - (Springer laboratory)
ISBN 978-3-540-69855-5 / 3-540-69855-8 Pp. : EUR 85.55 (freier Pr.), ca. sfr 135.50 (freier Pr.)
Literaturverz. S. 221 - 228
Quelle: DNB Verlagsmeldungen
