X-ray characterization of materials
/ Eric Lifshin (ed.). - Weinheim : Wiley-VCH, 1999. - XVI, 261 S. : Ill., graph. Darst.; 25 cm
ISBN 978-3-527-29657-6 / 3-527-29657-3 Pp. : DM 248.00, EUR 126.80
Literaturangaben
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Chang, Shih-Lin: X-Ray multiple wave diffraction
: theory and application / Shih-Lin Chang. - Berlin : Springer, 2004. - XII, 431 S. : Ill., graph. Darst.; 24 cm - (Springer series in solid-state sciences; 143)
ISBN 978-3-540-21196-9 / 3-540-21196-9 Pp. : EUR 139.05
Literaturverz. S. 387 - 407
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