Energy filtering transmission electron microscopy
/ Ludwig Reimer (ed.). With contributions by C. Deininger .... - Berlin : Springer, 1995. - XI, 424 S. : Ill., graph. Darst.; 25 cm - (Springer series in optical sciences; Vol. 71)
ISBN 978-3-540-58479-7 / 3-540-58479-X Pp. : DM 98.00
Literaturangaben
Quelle: DNB
Sharma, Renu: In-situ transmission electron microscopy experiments
: design and practice / Renu Sharma. - Weinheim, Germany : WILEY-VCH, 2023. - xxiii, 356 Seiten : Illustrationen; 26 cm, 898 g
ISBN 978-3-527-34798-8 / 3-527-34798-4 Festeinband : EUR 119.00 (DE) (freier Preis), EUR 122.40 (AT) (freier Preis)
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Reimer, Ludwig: Transmission electron microscopy
: physics of image formation and microanalysis / Ludwig Reimer. - 4. ed. - Berlin : Springer, 1997. - XVI, 584 S. : Ill., graph. Darst.; 24 cm - (Springer series in optical sciences; Vol. 36)
ISBN 978-3-540-62568-1 / 3-540-62568-2 Pp. : DM 108.00
Literaturverz. S. 494 - 569
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Reimer, Ludwig: Transmission electron microscopy
: physics of image formation and microanalysis / Ludwig Reimer. - 3. ed. - Berlin : Springer, 1993. - XIII, 545 S. : Ill., graph. Darst.; 24 cm - (Springer series in optical sciences; Vol. 36)
ISBN 978-3-540-56849-0 / 3-540-56849-2 kart. : DM 98.00
Literaturverz. S. 465 - 533
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Fultz, Brent: Transmission electron microscopy and diffractometry of materials
: with numerous exercises / Brent Fultz ; James Howe. - 3. ed. - Berlin : Springer, 2008. - XIX, 758 S. : Ill., graph. Darst.; 24 cm
ISBN 978-3-540-73885-5 / 3-540-73885-1 Pp. : ca. sfr 157.00 (freier Pr.)
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Transmission electron microscopy of semiconductor nanostructures
: analysis of composition and strain state / by. A. Rosenauer. - Berlin : Springer, 2003. - Online-Ressource - (Springer tracts in modern physics; Vol. 182)
ISBN 978-3-540-36407-8
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